Nick Winograd is Evan Pugh Professor of Chemistry at Penn State University. He has been working in the SIMS field for 35 years, publishing over 400 articles. He is known for his work in advancing a fundamental understanding of ion/solid interactions so that the technique can ultimately find new applications. With Barbara Garrison, he was one of the first to employ molecular dynamics computer simulations to understand the sputtering experiments. Along with this effort, he developed laser postionization methods to trace directly the trajectories of neutral particles and to enhance ionization probability. In recent years, Winograd has been interested in utilizing polyatomic projectiles such as C60 for molecular depth profiling and 3-dimensional imaging. He believes that this new combination will have a big impact in biology for the imaging of biological tissue and single cells. Winograd is currently Chair of the SIMS international committee. He is a fellow of the AAAS and the AVS. He has been a Sloan Fellow, a Guggenheim Fellow and has received a number of awards from the American Chemical Society, including the Akron section prize. Winograd is an avid runner, with 6 marathons under his belt. More details can be found on his website at nxw.chem.psu.edu.
Ian Gilmore Ian Gilmore is an NPL Fellow in Surface and nanoanalysis at the UK’s National Physical Laboratory and visiting Professor of Surface and nanoscale analysis at the University of Nottingham in the school of pharmacy. His research focus is on the analysis of complex molecules at surfaces and interfaces at different length scales. His research areas include secondary ion mass spectrometry where he has made important contributions to molecular identification through the innovation of a novel new variant of static SIMS called G-SIMS, building the underpinning science for cluster ion beams, including the enhancement of molecular secondary ion yield and organic depth profiling, developing the measurement infrastructure to support Desorption Electrospray Ionisation (DESI) and related ambient mass spectrometries, advances in multivariate analytical methods to interpret data, and the analysis of nanoparticles and fibres. Ian is very active in the development of International Standards through ISO TC 201 (surface chemical analysis) and ISO TC 229 (nanotechnologies), and leading pre-normative research through VAMAS interlaboratory studies (chair of TWA 2 Surface chemical analysis), and international traceability through key comparisons and pilot studies in CCQM. He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. He was awarded the Institute of Physics Paterson Medal (2004) and recently awarded Fellowship of the AVS. He is a Fellow of the Institute of Physics. Ian has authored and co-authored over 69 papers in surface analysis covering SIMS, AES and XPS. He is the secretariat of the International Committee for the SIMS conference series, and is chair of the AVS Applied Surface Science Division, and through international advisory boards for SIMS Europe, ECASIA, PSA (Asia-Pacific region) and AVS ASSD (chair-elect, 2009).
Current Interests: Secondary Ion Mass Spectrometry (sputtering and molecular emission by cluster ion beams, organic depth profiling, complex molecules at surfaces, novel cluster beams); Data interpretation, informatics and analysis (G-SIMS, molecular structure using G-SIMS Fragmentation Pathway Mapping and SMILES, Multivariate analysis); Chemical characterisation of nanoparticles using SIMS and other techniques; Atmospheric surface mass spectrometry (DESI, PADI, EESI); Development of standards in Surface Chemical Analysis; Biomolecular structure at different length scales and soft interfaces (use of High Resolution NMR).
Current Interests: Secondary Ion Mass Spectrometry (sputtering and molecular emission by cluster ion beams, organic depth profiling, complex molecules at surfaces, novel cluster beams); Data interpretation, informatics and analysis (G-SIMS, molecular structure using G-SIMS Fragmentation Pathway Mapping and SMILES, Multivariate analysis); Chemical characterisation of nanoparticles using SIMS and other techniques; Atmospheric surface mass spectrometry (DESI, PADI, EESI); Development of standards in Surface Chemical Analysis; Biomolecular structure at different length scales and soft interfaces (use of High Resolution NMR).
Fred Stevie
Fred Stevie is a Senior Researcher at the Analytical Instrumentation Facility in North Carolina State University and is responsible for SIMS and XPS analyses. His experience with materials characterization using ion beams and mass spectrometry spans more than 35 years, principally with Bell Laboratories. He has authored or co-authored more than 200 publications, including books on SIMS depth profiling and Focused Ion Beam (FIB), and has been awarded 20 patents.
His contributions to the SIMS field cover a wide range of topics that include quantification, characterization of ion implantation, surface roughening effects, surface and interfacial contaminants, back side analysis, polymer interfaces, and insulator analysis.
His FIB publications have concentrated on sample preparation for a range of analytical techniques and on FIB-SIMS.
His contributions to the SIMS field cover a wide range of topics that include quantification, characterization of ion implantation, surface roughening effects, surface and interfacial contaminants, back side analysis, polymer interfaces, and insulator analysis.
His FIB publications have concentrated on sample preparation for a range of analytical techniques and on FIB-SIMS.
Fred is a fellow of the American Vacuum Society (AVS), AVS course instructor for SIMS and FIB, and has been actively involved with the SIMS Workshop series and with a number of societies, particularly AVS and ASM International. He is a member of the SIMS International Organizing Committee, on the advisory board for Surface and Interface Analysis, and Associate Editor for Surface Science Spectra.
He received a M.S. degree in physics from Vanderbilt University in 1970.
He received a M.S. degree in physics from Vanderbilt University in 1970.
Salvatore Gennaro
Salvatore Gennaro was graduated in Chemistry at the University of Catania in 1996. After graduation he worked as research assistant at the Department of Chemistry of the University of Catania in the field of thin films production (by ion beam assisted sputter deposition and MOCVD processes) and characterization. He then moved to the University of Surrey where he obtained his PhD in 2003 working on the subject of dopant ion implantation and electrical activation in silicon. In 2004 he joined the Fondazione Bruno Kessler – irst (former ITC-irst) where he presently works as researcher within the Micro and Nano Analysis Laboratory (MiNALab) with main focus on SEM-EDX and ToF-SIMS analyses.
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Damiano Giubertoni
Damiano Giubertoni received a M.S. degree in physics from the University of Modena in 1999 and joined Fondazione Bruno Kessler – irst (former ITC-irst) in 2000, in Trento, Italy. He is currently a Researcher of the Micro and Nano Analysis Laboratory of FBK-irst where he works mainly on magnetic sector SIMS instrumentation. His ten years’ experience has been mainly focused on depth profiling of semiconductor materials, with particular experience on ultra-low energy SIMS for characterization of shallow distributions of dopant and contaminant in Si and related materials for micro- and opto-electronics. He has authored or co-authored more than 50 publications on international scientific journals and conference proceedings.
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