SIMS fundamentals.
Visualization of sputtering on the atomic and molecular level via molecular dynamics
Current theories of ionization in SIMS
Polyatomic projectiles – which ones and why?
Cluster/solid interactions
Energy and angular distributions of secondary ions
Quantification and Matrix effects
Molecular depth profiling
Comparison to inorganic depth profiling and Fred Stevie’s lectures
Erosion rates, topography and depth resolution
Projectile kinetic energy and the angle of incidence
Theoretical models
Issues for SIMS imaging
Sensitivity
Factors that affect lateral resolution
3-Dimensional experiments and the depth measurement condundrum
Instrumental issues
TOF’s, quadrupoles, magnetic sectors and hybrid machines
Tandem mass spectrometers
Mass resolution, transmission efficiency and charging
