Part I – Watching chemistry in hi-definition with secondary ion mass spectrometry
1. Instrument, optimisation and practical analysis
- Effects and constraints arising from ion and electron beam damages
- Detector efficiency
- Mass scale calibration
- Choice of primary ion
- Linearity of the intensity scale (dead-time correction)
- Repeatability and reproducibility
- ISO standards and accreditation to ISO 17025
2. Interpretation, identification and informatics
- Multivariate methods
- G-SIMS
- Informatics methods
3. Analysis of nano-objects
3.1 Imaging of organic materials
- Current performance of ion beams
- Useful lateral resolution
- Future requirements for ion beams
3.2 Organic depth profiling of nano-layers
- Practical organic depth profiling – what can be profiled?
- Optimisation of parameters (beam energy, projectile type, angle of incidence, sample rotation and sample cooling)
- Extending the materials that can be profiled (NO profiling, argon clusters).
- Instrumental considerations
- Outlook for industrial
3.3 Nanoparticles
- Sputtering yields
- Compositional depth profiling
- Surface molecular chemistry
- Instrumental optimisation
Part II – “I want to break free” – direct analysis by ambient surface mass spectrometry
We will cover recent advances in ambient surface mass spectrometry highlighting their strengths and weaknesses.
- Desorption Electrospray Ionisation (DESI)
- Plasma methods (PADI, LTP, DART)
- Contact methods (LESA)
- Laser methods (AP-MALDI, Laserspray)
Part III – Trying it out – hands on experiments and tutorials
- ISO 23830 – Surface chemical analysis — Secondary-ion mass spectrometry — Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
- Organic depth profiling of a VAMAS Irganox delta-layer
- Multivariate analysis
